Thursday, December 15, 2005

Trends in Scanning Probe / Atomic Force Microscopy

( NOTE - LIST IS IN NO PARTICULAR ORDER
Moreover if you are inexperienced in SPM the most critcal sauce in best in class instrumentation is

1] SOFTWARE - robustness of code, ease of re-programmability, nanolitho, # of useful features & max image pixel counts .... and
2] CONTROLLER HARDWARE - simplicity yet power through elegant feature rich designs.

There is only one firm with both of these criteria met in their core products.

The scanner and probe interests reflected in this post are somewhat avant garde - not yet reflected in commercial products, moreover with Degertekin's FIRAT, probe technology might soon become quite an interesting area as to innovation ...enuf said to the afficionados out there and there seem to many readers in the South Coast who know this obvious stuff well. ED. )

Faster imaging

Parallel probe microscopes commercialized



( picture - by kind permission of Prof. Cal Quate of Stanford )






Softer forces


Sharper and duller tips
( controlled radius )

R/T imaging - bio & materials, in air and fluid





Ando's fast bio scanner





Ando's Microscope Optical Detection Path







( pictures of Real-Time Scanning BioMolecular AFM - by kind permission of Prof. Toshio Ando, Kanazawa University )







Improved stability conducting nanoprobes


Higher pixel count imaging
( like the best 4th gen uScope controllers )

Lower tracking servo error excursions
( less force error - reduced under & overshoot excursions )

Methods for commercial nanotube modified tips of good orientation and yield







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