Tuesday, January 16, 2007

Patents of Xradia - High Resolution Xray Microscopy

Phase Contrast Microscope for Short Wavelength Radiation and Imaging Method
High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
Phase contrast microscope for short wavelength radiation and imaging method
Lens Bonded X-Ray Scintillator System and Manufacturing Method Therefor
Near-field X-ray fluorescence microprobe
Low Pass X-Ray Scintillator System
Scintillator optical system and method of manufacture
Back-end-of-line metallization inspection and metrology microscopy system and method using x-ray fluorescence
Dual-band detector system for x-ray imaging of biological samples
ACHROMATIC FRESNEL OPTICS FOR ULTRAVIOLET AND X-RAY RADIATION
Achromatic fresnel optics for ultraviolet and x-ray radiation
Reflective lithography mask inspection tool based on achromatic Fresnel optics

Element-specific X-ray fluorescence microscope and method of operation
Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations
Short wavelength metrology imaging system
Fabrication methods for micro compound optics
Phase contrast microscope for short wavelength radiation and imaging method
Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations
Reflective lithography mask inspection tool based on achromatic fresnel optics
Element-specific X-ray fluorescence microscope and method of operation





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